Scanning electron microscopy and x-ray microanalysis
著者
書誌事項
Scanning electron microscopy and x-ray microanalysis
PTR Prentice Hall, c1993
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注記
Includes bibliographical references (p. 439-441) and index
内容説明・目次
内容説明
A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.
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