Proceedings : International Test Conference 1993

著者

• International Test Conference
• IEEE Computer Society

書誌事項

Proceedings : International Test Conference 1993

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference, c1993

• : soft
• : case

タイトル別名

ITC : International Test Conference 1993

1993 IEEE International Test Conference

Designing, testing, and diagnostics - join them

注記

At head of title: ITC : International Test Conference 1993

"October 17-21, 1993, Convention Center, Baltimore, Maryland, USA"--Cover

"IEEE Catalog Number 93CH3356-3."--T.p. verso

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA2136134X
• ISBN:
  • 0780314298
  • 0780314301
• LCCN: 93080010
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Altoona, PA
• ページ数/冊数: xii, 1065 p.
• 大きさ: 29 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses