Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

書誌事項

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

editors, Kenneth P. Rodbell ... [et al.]

(Materials Research Society symposium proceedings, v. 309)

Materials Research Society, c1993

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

「Nielsen BookData」 より

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