The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy : proceedings

Bibliographic Information

The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy : proceedings

edited by F. Lombardi ... [et al.] ; sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing

IEEE Computer Society Press, c1993

Available at  / 5 libraries

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Note

Includes bibliographical references and index

"IEEE Computer Society Press order number 3502-02"

"IEEE catalog number 93TH0571-0"

Details

  • NCID
    BA21465414
  • ISBN
    • 0818635029
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Los Alamitos, CA.
  • Pages/Volumes
    xiii, 336 p.
  • Size
    24 cm
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