Digital integrated circuit testing from a quality perspective

Author(s)

• Hnatek, Eugene R.

Bibliographic Information

Digital integrated circuit testing from a quality perspective

Eugene R. Hnatek

Van Nostrand Reinhold, c1993

Note

Includes bibliographical references and index

Details

• NCID: BA21928498
• ISBN:
  • 0442006438
• LCCN: 93013739
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: x, 179 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.3815/48
• Subject Headings:
  • LCSH : Digital integrated circuits -- Testing -- Quality control