Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

著者

• Asian Test Symposium (2nd : 1993 : Beijing, China)
• IEEE Computer Society. Test Technology Technical Committee

書誌事項

Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

sponsored by the IEEE Computer Society, Test Technology Technical Committee ; in cooperation with China Computer Federation (CCF), Institute of Computing Technology (ICT), CAS, National Natural Science Foundation of China (NSFC)

IEEE Computer Society Press, c1993

• : paper
• : microfiche

タイトル別名

ATS '93 proceedings

注記

"IEEE Computer Society Press order number 3930-02

"IEEE Catalog Number 93TH0564-5

Includes bibliographies and index

内容説明・目次

内容説明

Proceedings of the 2nd Asian Test Symposium held in Beijing, China, in November 1993. Among the topics: fault tolerance, analog and mixed circuit testing, and testability analysis. No index. Annotation copyright Book News, Inc. Portland, Or.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA22003389
• ISBN:
  • 081863930X
  • 0818639318
• LCCN: 93077783
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA
• ページ数/冊数: xii, 341 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses