Trace analysis and technological development : special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)

著者

• Das, M. Sankar
• International Symposium on Trace Analysis and Technological Development (1st : 1981 : Bhabha Atomic Research Centre)
• International Union of Pure and Applied Chemistry

書誌事項

Trace analysis and technological development : special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)

editor, M. Sankar Das

Wiley, c1983

注記

Co-sponsored by International Union of Pure and Applied Chemistry

"Presented at the First International Symposium on Trace Analysis and Technological Development"--Pref

"A Halsted Press book."

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA2201971X
• ISBN:
  • 047027462X
• LCCN: 83012788
• 出版国コード: us
• タイトル言語コード: eng
• 出版地: New York
• ページ数/冊数: x, 407 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QD139.T7
  • DC19 : 543
• 件名:
  • LCSH : Trace analysis -- Congresses