Statistical approach to VLSI

著者

• Director, Stephen W.
• Maly, W.

書誌事項

Statistical approach to VLSI

[edited by] S.W. Director, W. Maly

（Advances in CAD for VLSI, v. 8）

North-Holland, 1994

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA22038678
• ISBN:
  • 0444883711
• LCCN: 93046624
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam ; New York
• ページ数/冊数: x, 391 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7874.75
  • DC20 : 621.39/5/015195
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Defects
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Statistical methods
  • LCSH : Mathematical optimization
• 親書誌ID:
  • BA00122657