Statistical approach to VLSI
著者
書誌事項
Statistical approach to VLSI
（Advances in CAD for VLSI, v. 8）
North-Holland, 1994
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
This volume is the first complete overview of VLSI design methods that use statistical techniques for dealing with the random phenomena that are inherent in all VLSI manufacturing processes. VLSI design today cannot be performed without taking into account economic-related issues such as yield, cost and performance-oriented tradeoffs. The book includes practical methods relevant to real-life applications. It contains edited papers by top industrial and academic specialists in the field. These papers describe all three categories of CAD tools employed for statistical design: IC performance optimization tools, process simulation tools and tools for characterization of process fluctuations. In each category both practical approaches and more theoretical approaches are presented.
目次
- Part 1 Introduction: Introduction to design for manufacturability of VLSI circuits (W. Maly). Part 2 Statistical Design - Theory: Introduction to parametric yield optimization (S.W. Director, K. Krishna P. Feldmann). Advanced yield optimization techniques, (K.J. Antreich, H.E. Graeb, R.K. Koblitz). Part 3 Statistical Design - Applications: Applications of statistical methods to IC design, (J.P. Spoto)
- Statistical worst-case analysis for integrated circuits (S.R. Nassif). Statistical analysis in VLSI process circuit design (P. Chattejee et al.). A simulation-based approach to parametric performance test development (J.B. Brockman, S.W. Director). Part 4 Characterization and Simulation of VLSI Manufacturing Process: Statistical simulation of modern industrial fabrication process (P.K. Mozumder, A.J. Strojwas). Advanced process identification techniques (C.J. Spanos).
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