Statistical approach to VLSI

Author(s)

• Director, Stephen W.
• Maly, W.

Bibliographic Information

Statistical approach to VLSI

[edited by] S.W. Director, W. Maly

（Advances in CAD for VLSI, v. 8）

North-Holland, 1994

Note

Includes bibliographical references and index

Details

• NCID: BA22038678
• ISBN:
  • 0444883711
• LCCN: 93046624
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; New York
• Pages/Volumes: x, 391 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874.75
  • DC20 : 621.39/5/015195
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Defects
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Statistical methods
  • LCSH : Mathematical optimization
• Parent Bibliography ID:
  • BA00122657