1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994

Author(s)

• IEEE International Reliability and Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994

sponsored by the IEEE Electron Devices Society and the IEEE Reliability

Institute of Electrical and Electronics Engineers, c1994

• : soft.
• : case.
• : micro.

Other Title

1994 IEEE Annual International Reliability Physics

94CH33324

Note

Includes bibliographies

"IEEE Catalog No. 94CH3332-4."

Details

• NCID: BA22624488
• ISBN:
  • 0780313577
  • 0780313585
  • 0780313593
• LCCN: 82640313
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway
• Pages/Volumes: xi, 505 p.
• Size: 28 cm