1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994

著者

• IEEE International Reliability and Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994

sponsored by the IEEE Electron Devices Society and the IEEE Reliability

Institute of Electrical and Electronics Engineers, c1994

• : soft.
• : case.
• : micro.

タイトル別名

1994 IEEE Annual International Reliability Physics

94CH33324

注記

Includes bibliographies

"IEEE Catalog No. 94CH3332-4."

詳細情報

• NII書誌ID(NCID): BA22624488
• ISBN:
  • 0780313577
  • 0780313585
  • 0780313593
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: xi, 505 p.
• 大きさ: 28 cm