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書誌事項
NBS-GCR
The Center , National Technical Information Service, distributor
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関連文献: 6件中 1-6を表示
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1
- Structureborne sound in buildings : needed practical research in light of the current state of the art
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Eric E. Ungar ; sponsored by Bolt Beranek and Newman, Inc. ; prepared for Center for Building Technology, National Engineering Laboratory, National Bureau of Standards, U.S. Department of Commerce
The Center , National Technical Information Service, distributor 1980] NBS-GCR 80-248
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2
- High-speed spreading resistance probe
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N. Goldsmith and A. Mayer
[US Department of Commerce, National Bureau of Standards] 1979 NBS-GCR 79-166
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3
- Techniques for the preparation and analysis of standard silicon semiconductor specimens for the ion microprobe mass analyzer
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Graydon Larrabee, Robert Dobrott
[US Department of Commerce, National Bureau of Standards] 1979 NBS-GCR 79-158
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4
- Extended range c(V) measurement : a technique for monitoring semiconductor device processing
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A.M. Goodman
[US Department of Commerce, National Bureau of Standards] 1979 NBS-GCR 78-155
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5
- Development of measurement techniques for monitoring chemical purity of materials used in digital IC processing
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J. Stach, M.B. Das, R.E. Tressler
[US Department of Commerce, National Bureau of Standards] 1978 NBS-GCR 78-134
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6
- Automated integrated circuit processing and assembly
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H. Gunther Rudenberg
[US Department of Commerce, National Bureau of Standards] 1975 NBS-GCR 76-64
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