ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California

sponsored by the IEEE Electron Devices Society

IEEE Service Center, c1994

• : soft.
• : case.
• : micro.

タイトル別名

1994 IEEE International Conference on Microelectronic Test Structures

94CH3380-3

注記

Includes bibliographical references and index

"94CH3380-3."

詳細情報

• NII書誌ID(NCID): BA22804752
• ISBN:
  • 0780317572
  • 0780317580
  • 0780317599
• LCCN: 93080496
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway
• ページ数/冊数: xi, 224 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/5
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses