Interpretive techniques for microstructural analysis
著者
書誌事項
Interpretive techniques for microstructural analysis
Plenum Press, c1977
大学図書館所蔵 件 / 全8件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
"Proceedings of a symposium ... held in Minneapolis, Minnesota, June 29-30, 1975."
Includes bibliographical references and indexes
内容説明・目次
内容説明
In recent years microstructural analysis has been a rapidly changing field of scien- tific endeavor. No longer are the efforts of the microstructural analysts (sometimes referred to as metallographers, materialographers, ceramographers, and similar desig- nations) limited to the tasks of polishing, etching, and photographing specimens of materials. The performance demanded of materials used for many current applica- tions requires much more complete characterizations than were possible only a scant few years ago. Although the individuals who have been expected to develop new and improved techniques to permit these required characterizations have been severely challenged, in large part they have met the challenge. In view of the many new developments in the field of microstructural analysis and recognizing the requirements to communicate these developments to the wide audience that might make use of them, the American Society for Metals and the In- ternational Metallographic Society joined forces to co-sponsor a symposium that was intended to bring participants and attendees up to date on the subject "Inter- pretive Techniques for Microstructural Analysis".
This symposium was held in Min- neapolis, Minnesota, USA, June 29 and 30, 1975. It followed two earlier symposia co-sponsored by the same two societies on other subjects of current interest to the metallographic community, Microstructural Analysis - Tools and Techniques, 1972, and Metallographic Specimen Preparation - Optical and Electron Micros- copy, 1973.
目次
- Basic Photographic Optics for the Metallurgist.- Photographic Methods.- Applications of Color in Metallography and Photography.- Measuring with the Optical Microscope.- Differential Interference Contrast Microscopy.- Surface Topographic Characterization Employing Optical Methods
- Survey of Quantitative and Qualitative Methods.- Microhardness Testing and Hardness Numbers.- Non-Ambient Temperature Microscopy.- Remote Metallography.- Holographic Microscopy.- Achieving Optimum Optical Performance Through a Customized Maintenance Program.- Author Index.
「Nielsen BookData」 より