Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

著者

• Queisser, Hans J.
• Electrochemical Society. Electronics Division
• Electrochemical Society. Dielectric Science and Technology Division

書誌事項

Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions

（Proceedings / [Electrochemical Society], v. 94-1）

The Electrochemical Society, c1994

注記

Includes bibliographies and index

"held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, LA"

詳細情報

• NII書誌ID(NCID): BA23030106
• ISBN:
  • 1566770378
• LCCN: 93072866
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: viii, 319 p.
• 大きさ: 23 cm
• 親書誌ID:
  • BA01323290