Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

Author(s)

• Queisser, Hans J.
• Electrochemical Society. Electronics Division
• Electrochemical Society. Dielectric Science and Technology Division

Bibliographic Information

Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions

（Proceedings / [Electrochemical Society], v. 94-1）

The Electrochemical Society, c1994

Note

Includes bibliographies and index

"held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, LA"

• NCID: BA23030106
• ISBN:
  • 1566770378
• LCCN: 93072866
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pennington, NJ
• Pages/Volumes: viii, 319 p.
• Size: 23 cm
• Parent Bibliography ID:
  • BA01323290