Yield and reliability in microwave circuit and system design

書誌事項

Yield and reliability in microwave circuit and system design

Michael D. Meehan and John Purviance

(The Artech House microwave library)

Artech House, c1993

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

目次

  • Yield
  • calculating yield
  • statistical sensitivity
  • yield optimization
  • statistical modeling
  • case studies and examples.

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