Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California

著者

• Aspnes, D. E.
• Speyer, J. S. (Jacob Samuel)
• Potter, Roy F.

書誌事項

Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California

D.E. Aspnes, S. So, R.F. Potter, editors

（Proceedings of the Society of Photo-Optical Instrumentation Engineers, v. 276）

S.P.I.E.-- Society of Photo-optical Instrumentation Engineers, 1981

• pbk.

注記

Includes bibliographical references and indexes

• NII書誌ID(NCID): BA23923983
• ISBN:
  • 0892523093
• LCCN: 81051404
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: x, 262 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.85
  • DC19 : 621.3815/2/0287
• 件名:
  • LCSH : Semiconductors -- Testing -- Optical methods -- Congresses
• 親書誌ID:
  • BA0118856X