Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California

Author(s)

• Aspnes, D. E.
• Speyer, J. S. (Jacob Samuel)
• Potter, Roy F.

Bibliographic Information

Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California

D.E. Aspnes, S. So, R.F. Potter, editors

（Proceedings of the Society of Photo-Optical Instrumentation Engineers, v. 276）

S.P.I.E.-- Society of Photo-optical Instrumentation Engineers, 1981

• pbk.

Note

Includes bibliographical references and indexes

Details

• NCID: BA23923983
• ISBN:
  • 0892523093
• LCCN: 81051404
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: x, 262 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.85
  • DC19 : 621.3815/2/0287
• Subject Headings:
  • LCSH : Semiconductors -- Testing -- Optical methods -- Congresses
• Parent Bibliography ID:
  • BA0118856X