Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia

Author(s)

• Lee, John J.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia

chairman/editor: John J. Lee, Jr

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 416）

S.P.I.E.-- International Society for Optical Engineering, c1983

• pbk.

Note

Includes bibliographical references and index

• NCID: BA23957828
• ISBN:
  • 0892524510
• LCCN: 83050363
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vi, 214 p.
• Size: 28 cm
• Classification:
  • LCC : QC367
  • DC19 : 681/.2
• Subject Headings:
  • LCSH : Optical measurements -- Congresses
• Parent Bibliography ID:
  • BA0022700X