Modeling of electrical overstress in integrated circuits

著者

• Díaz, Carlos H. (Carlos Hernando)
• Kang, Sung-Mo
• Duvvury, Charvaka

書誌事項

Modeling of electrical overstress in integrated circuits

Carlos H. Díaz, Sung-Mo (Steve) Kang, Charvaka Duvvury

（The Kluwer international series in engineering and computer science, SECS 289）

Kluwer Academic Publishers, c1995

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA2397191X
• ISBN:
  • 0792395050
• LCCN: 94031195
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xxiii, 148 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Protection -- Computer simulation
  • LCSH : Electric discharges -- Computer simulation
• 親書誌ID:
  • BA0004729X