Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 525)

SPIE--the International Society for Optical Engineering, c1985

  • pbk.

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Includes bibliographies and index

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    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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