Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

Author(s)

• Baker, L. R. (Lionel R.)
• Bennett, Harold Earl
• Sira Limited

Bibliographic Information

Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 525）

SPIE--the International Society for Optical Engineering, c1985

• pbk.

Note

Includes bibliographies and index

• NCID: BA23996502
• ISBN:
  • 0892525606
• LCCN: 85050425
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vi, 198 p.
• Size: 28 cm
• Classification:
  • LCC : TS517.3
  • DC19 : 681/.423
• Subject Headings:
  • LCSH : Lenses -- Defects -- Congresses
• Parent Bibliography ID:
  • BA0022700X