Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

著者

• Baker, L. R. (Lionel R.)
• Bennett, Harold Earl
• Sira Limited

書誌事項

Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 525）

SPIE--the International Society for Optical Engineering, c1985

• pbk.

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA23996502
• ISBN:
  • 0892525606
• LCCN: 85050425
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 198 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS517.3
  • DC19 : 681/.423
• 件名:
  • LCSH : Lenses -- Defects -- Congresses
• 親書誌ID:
  • BA0022700X