X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California

著者

• Rusch, Thomas William
• University of Rochester. Institute of Optics
• Society of Photo-optical Instrumentation Engineers

書誌事項

X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California

Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 690）

SPIE--the International Society for Optical Engineering, c1986

• pbk.

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA24030633
• ISBN:
  • 0892527250
• LCCN: 86061937
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 156 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA417.2
  • DC19 : 620.1/127
• 件名:
  • LCSH : Non-destructive testing -- Congresses
  • LCSH : X-ray spectroscopy -- Congresses
  • LCSH : Materials -- Testing -- Congresses
• 親書誌ID:
  • BA0022700X