X-ray imaging II : 21-22 August 1986, San Diego, California

著者

• Knight, Larry V.
• Bowen, D. Keith (David Keith)
• University of Rochester. Institute of Optics
• Society of Photo-optical Instrumentation Engineers

書誌事項

X-ray imaging II : 21-22 August 1986, San Diego, California

Larry V. Knight, D. Keith Bowen, chairmen/editors ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 691）

SPIE--the International Society for Optical Engineering, c1986

• pbk.

注記

Includes bibliographies and index

• NII書誌ID(NCID): BA24031170
• ISBN:
  • 0892527269
• LCCN: 86062020
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 149 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1632
  • DC19 : 621.36/73
• 件名:
  • LCSH : Imaging systems -- Congresses
  • LCSH : X-rays -- Congresses
• 親書誌ID:
  • BA0022700X