Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts

Author(s)

• Chen, Michael J. W.
• Thibadeau, Robert
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts

Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 730）

SPIE--the International Society for Optical Engineering, c1987

• pbk.

Note

Includes bibliographies and index

Details

• NCID: BA24042031
• ISBN:
  • 089252765X
• LCCN: 86063732
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vi, 256 p.
• Size: 28 cm
• Classification:
  • LCC : TS156.2
  • DC19 : 681/.2
• Subject Headings:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
• Parent Bibliography ID:
  • BA0022700X