Automated inspection and high speed vision architectures : 3-4 November, 1987, Cambridge, Massachusetts

Author(s)

• Chen, Michael J. W.
• Ahlers, Rolf-Jürgen
• Society of Photo-optical Instrumentation Engineers
• IEEE Industrial Electronics Society
• 計測自動制御学会 ケイソク ジドウ セイギョ ガッカイ

Bibliographic Information

Automated inspection and high speed vision architectures : 3-4 November, 1987, Cambridge, Massachusetts

Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 849）

SPIE--the International Society for Optical Engineering, c1988

Note

Includes bibliographies and index

• NCID: BA24066630
• ISBN:
  • 0892528842
• LCCN: 87063195
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vi, 274 p.
• Size: 28 cm
• Classification:
  • LCC : TS156.2
  • DC19 : 681/.4
• Subject Headings:
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Computer vision -- Congresses
• Parent Bibliography ID:
  • BA0022700X