{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA24156030.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA24156030#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA24156030.json"},"dc:title":[{"@value":"Imperfections and impurities in semiconductor silicon"}],"dc:creator":"K.V. Ravi","dc:publisher":[{"@value":"Wiley"}],"dcterms:extent":"xiv, 379 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"1981","cinii:ncid":"BA24156030","cinii:ownerCount":"10","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA01783719#entity","@type":"foaf:Person","foaf:name":[{"@value":"Ravi, K. V."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001379","@type":"foaf:Organization","foaf:name":"東北大学 附属図書館","rdfs:seeAlso":{"@id":"http://opac.library.tohoku.ac.jp/opac/opac_openurl/?ncid=BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA001732","@type":"foaf:Organization","foaf:name":"群馬大学 総合情報メディアセンター 理工学図書館","rdfs:seeAlso":{"@id":"http://opac.lib.gunma-u.ac.jp/opc/recordID/catalog.bib/BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA011791","@type":"foaf:Organization","foaf:name":"東京大学 工学部・工学系研究科","rdfs:seeAlso":{"@id":"https://opac.dl.itc.u-tokyo.ac.jp/opac/opac_openurl/?ncid=BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA011791","@type":"foaf:Organization","foaf:name":"東京大学 工学部・工学系研究科","rdfs:seeAlso":{"@id":"https://opac.dl.itc.u-tokyo.ac.jp/opac/opac_openurl/?ncid=BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA002495","@type":"foaf:Organization","foaf:name":"名古屋大学 工学 図書室","rdfs:seeAlso":{"@id":"https://m-opac.nul.nagoya-u.ac.jp/iwjs0023opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA24156030&initFlg=_RESULT_SET_NOTBIB"}},{"@id":"https://ci.nii.ac.jp/library/FA002553","@type":"foaf:Organization","foaf:name":"豊橋技術科学大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.lib.tut.ac.jp/mylimedio/search/search.do?target=local&mode=comp&category-mgz=1&category-book=1&annex=all&ncid=BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA002848","@type":"foaf:Organization","foaf:name":"大阪大学 附属図書館 総合図書館","rdfs:seeAlso":{"@id":"https://opac.library.osaka-u.ac.jp/opac/opac_openurl/?ncid=BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA006066","@type":"foaf:Organization","foaf:name":"東京電機大学 総合メディアセンター 千住センター"},{"@id":"https://ci.nii.ac.jp/library/FA025195","@type":"foaf:Organization","foaf:name":"東京理科大学 葛飾図書館","rdfs:seeAlso":{"@id":"https://jimkilisop1.admin.tus.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA24156030"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA24156030"}}],"bibo:lccn":["80021978"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/80021978"}],"prism:publicationDate":["c1981"],"cinii:note":["\"A Wiley-Interscience publication.\"","Includes bibliographical references and index"],"dc:subject":["LCC:QC611.8.S5","DC19:537.6/22"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Silicon+--+Defects","dc:title":"Silicon -- Defects"},{"@id":"https://ci.nii.ac.jp/books/search?q=Semiconductors+--+Defects","dc:title":"Semiconductors -- Defects"}],"dcterms:hasPart":[{"@id":"urn:isbn:0471078174"}]}]}