Test and evaluation of infrared detectors and arrays : 27-29 March 1989, Orlando, Florida

著者

• Hoke, Forney M.
• Society of Photo-optical Instrumentation Engineers
• New Mexico State University. Applied Optics Laboratory

書誌事項

Test and evaluation of infrared detectors and arrays : 27-29 March 1989, Orlando, Florida

Forney M. Hoke ; sponsored by SPIE -- the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1108）

SPIE, c1989

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA24257242
• ISBN:
  • 0819401447
• LCCN: 89061604
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vi, 306 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X