Laser interferometry, quantitative analysis of interferograms : third in a series : 7-9 August 1989, San Diego, California

Author(s)

• Pryputniewicz, Ryszard J.
• Society of Photo-optical Instrumentation Engineers
• New Mexico State University. Applied Optics Laboratory
• International Symposium on Optical and Optoelectronic Applied Sciences and Engineering

Bibliographic Information

Laser interferometry, quantitative analysis of interferograms : third in a series : 7-9 August 1989, San Diego, California

Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1162）

SPIE, c1990

Note

"Part of a four-conference program o n Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11-August 1989, in San Diego, California"--P. vii

Includes bibliographical references and index

Details

• NCID: BA24342705
• ISBN:
  • 0819401986
• LCCN: 89043272
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: ix, 468 p.
• Size: 28 cm
• Classification:
  • LCC : TA1673
  • DC20 : 621.36/6
• Subject Headings:
  • LCSH : Lasers -- Industrial applications -- Congresses
  • LCSH : Laser interferometers -- Industrial applications -- Congresses
• Parent Bibliography ID:
  • BA0022700X