Laser interferometry, quantitative analysis of interferograms : third in a series : 7-9 August 1989, San Diego, California
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書誌事項
Laser interferometry, quantitative analysis of interferograms : third in a series : 7-9 August 1989, San Diego, California
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 1162)
SPIE, c1990
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注記
"Part of a four-conference program o n Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11-August 1989, in San Diego, California"--P. vii
Includes bibliographical references and index