Fringe pattern analysis : 8-9 August 1989, San Diego, California

Author(s)

• Reid, Graeme T.
• Society of Photo-optical Instrumentation Engineers
• SPIE Conference on Fringe Pattern Analysis

Bibliographic Information

Fringe pattern analysis : 8-9 August 1989, San Diego, California

Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1163）

SPIE, c1989

Note

"Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd

Includes bibliographical references and index

Details

• NCID: BA24342840
• ISBN:
  • 0819401994
• LCCN: 89043273
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vi, 260 p.
• Size: 28 cm
• Classification:
  • LCC : QC415
  • DC20 : 621.36
• Subject Headings:
  • LCSH : Diffraction patterns -- Congresses
  • LCSH : Interferometry -- Congresses
  • LCSH : Image processing -- Congresses
• Parent Bibliography ID:
  • BA0022700X