Surface characterization and testing II : 10-11 August 1989, San Diego, California

Author(s)

• Greivenkamp, John E.
• Young, Matt
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Surface characterization and testing II : 10-11 August 1989, San Diego, California

John E. Greivenkamp, Matt Young, chairs/editors

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1164）

SPIE--the International Society for Optical Engineering, c1989

Note

"Sponsored by SPIE--the International Society for Optical Engineering."

Includes bibliographical references and index

• NCID: BA24342953
• ISBN:
  • 0819402001
• LCCN: 89043274
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vi, 271 p.
• Size: 28 cm
• Classification:
  • LCC : TA418.7
  • DC20 : 620/.44
• Subject Headings:
  • LCSH : Surfaces (Technology) -- Testing -- Congresses
  • LCSH : Surfaces (Technology) -- Optical properties -- Congresses
• Parent Bibliography ID:
  • BA0022700X