Surface characterization and testing II : 10-11 August 1989, San Diego, California

著者

• Greivenkamp, John E.
• Young, Matt
• Society of Photo-optical Instrumentation Engineers

書誌事項

Surface characterization and testing II : 10-11 August 1989, San Diego, California

John E. Greivenkamp, Matt Young, chairs/editors

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1164）

SPIE--the International Society for Optical Engineering, c1989

注記

"Sponsored by SPIE--the International Society for Optical Engineering."

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA24342953
• ISBN:
  • 0819402001
• LCCN: 89043274
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 271 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA418.7
  • DC20 : 620/.44
• 件名:
  • LCSH : Surfaces (Technology) -- Testing -- Congresses
  • LCSH : Surfaces (Technology) -- Optical properties -- Congresses
• 親書誌ID:
  • BA0022700X