Particles on surfaces : detection, adhesion, and removal

著者

書誌事項

Particles on surfaces : detection, adhesion, and removal

edited by K. L. Mittal

Dekker, c1995

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注記

"Proceedings of the Fourth Symposium on Particles on Surfaces: Detection, Adhesion, and Removal held as a part of the 23rd Annual meeting of the Fine Particle Society in Las Vegas, Nevada, July 13-17, 1992"--preface

Includes bibliographies and index

内容説明・目次

内容説明

This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.

目次

  • Particles on surfaces - adhesion induced deformations
  • surface force tensile interactions between micrometer size particles and a polyester-PDMS block copolymer substrate
  • polymer to particle adhesion probed with atomic force microscopy
  • surface particle contamination identification in microelectronics
  • an overview of spacecraft particulate contamination phenomena
  • contamination on optical surfaces-concerns, prevention, detection, and removal
  • an advanced surface particle and molecular contaminant identification, removal, and collection system
  • the role of air ionization in reducing surface contamination by particles in the cleanroom
  • selecting a contamination-free deburring process - testing abrasive blasting media
  • particle generation and control in tubing and piping connection design
  • detection and identification of particles on silicon surfaces
  • the characterization of particles on spacecraft returned from orbit
  • a light-scattering method for determining the composition of particles on surfaces
  • light scattering by spherical particles on planar multi-layered substrates
  • new test procedure for the examination of the particulate cleanliness of technical surfaces
  • discrimination between particulate and film type contamination on surfaces by means of total reflection X-ray fluorescence spectrometry
  • particle characterization on surfaces by Auger electron spectroscopy
  • interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves
  • removal of glass particles from glass surfaces - a review
  • particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement
  • fluid dynamics of liquid jets used for particle removal from surfaces
  • enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions
  • laser cleaning techniques for the removal of small surface particulates.

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