{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA24383462.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA24383462#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA24383462.json"},"dc:title":[{"@value":"SAT, the math workbook"}],"dcterms:alternative":["Scholastic Aptitude Test, the math workbook"],"dc:creator":"by the staff of Stanley H. Kaplan Educational Center, Ltd","dc:publisher":[{"@value":"Bantam Doubleday Dell"}],"dcterms:extent":"226 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1994","cinii:ncid":"BA24383462","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA08885954#entity","@type":"foaf:Person","foaf:name":[{"@value":"Stanley H. Kaplan Educational Center (New York, N.Y.)"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA005518","@type":"foaf:Organization","foaf:name":"清泉女子大学 附属図書館","rdfs:seeAlso":{"@id":"http://lib.seisen-u.ac.jp/mylimedio/search/search.do?ncid=BA24383462"}}],"bibo:lccn":["93020962"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/93020962"}],"prism:publicationDate":["1994"],"dc:subject":["LCC:QA43","DC20:510/.76"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Mathematics+--+Examinations%2C+questions%2C+etc","dc:title":"Mathematics -- Examinations, questions, etc"},{"@id":"https://ci.nii.ac.jp/books/search?q=Scholastic+Aptitude+Test+--+Study+guides","dc:title":"Scholastic Aptitude Test -- Study guides"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA24383349#entity","dc:title":"Kaplan sourcebooks","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:0385311532"}]}]}