Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts

Author(s)

• Wadekar, Shekhar G.
• Society of Photo-optical Instrumentation Engineers
• New Mexico State University. Applied Optics Laboratory

Bibliographic Information

Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts

Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1180）

SPIE, c1990

Note

Includes bibliographical references and index

Details

• NCID: BA24456293
• ISBN:
  • 0819402168
• LCCN: 89043443
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vi, 196 p.
• Size: 28 cm
• Parent Bibliography ID:
  • BA0022700X