Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts
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書誌事項
Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 1180)
SPIE, c1990
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注記
Includes bibliographical references and index