Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A.

Author(s)

• Børgesen, Peter

Bibliographic Information

Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A.

editors, Peter Børgesen ... [et. al.]

（Materials Research Society symposium proceedings, v. 338）

Materials Research Society, c1994

Note

Includes index

Details

• NCID: BA24505719
• ISBN:
  • 1558992383
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: xv, 630 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381
• Subject Headings:
  • LCSH : Microelectronics -- Reliability -- Congresses
  • LCSH : Microelectronics -- Materials -- Testing -- Congresses
  • LCSH : Electrodiffusion -- Congresses
  • LCSH : Microstructure -- Congresses
• Parent Bibliography ID:
  • BA00013775