Yield and variability optimization of integrated circuits

Author(s)

• Zhang, J. C.
• Styblinski, M. A.

Bibliographic Information

Yield and variability optimization of integrated circuits

J.C. Zhang, M.A. Styblinski

Kluwer Academic Publishers, c1995

Note

Includes bibliographical references (p. 221-231) and index

Details

• NCID: BA24689032
• ISBN:
  • 0792395514
• LCCN: 94044624
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xv, 234 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.3815
• Subject Headings:
  • LCSH : Integrated circuits -- Design and construction -- Statistical methods
  • LCSH : Integrated circuits -- Reliability
  • LCSH : Integrated circuits -- Defects