Yield and variability optimization of integrated circuits

著者

• Zhang, J. C.
• Styblinski, M. A.

書誌事項

Yield and variability optimization of integrated circuits

J.C. Zhang, M.A. Styblinski

Kluwer Academic Publishers, c1995

注記

Includes bibliographical references (p. 221-231) and index

• NII書誌ID(NCID): BA24689032
• ISBN:
  • 0792395514
• LCCN: 94044624
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xv, 234 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Design and construction -- Statistical methods
  • LCSH : Integrated circuits -- Reliability
  • LCSH : Integrated circuits -- Defects