Analog signal generation for built-in-self-test of mixed-signal integrated circuits
著者
書誌事項
Analog signal generation for built-in-self-test of mixed-signal integrated circuits
（The Kluwer international series in engineering and computer science, SECS 312 . Analog circuits and signal processing）
Kluwer Academic Publishers, c1995
大学図書館所蔵 件 / 全5件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references and index
内容説明・目次
内容説明
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
目次
Preface. 1. Introduction. 2. An Oversampling-Based Analog Oscillator. 3. Analog Multi-Tone Signal Generation. 4. An Oversampling-Based Function Generator. 5. Conclusion. A: Delta-Sigma Modulation. B: VHDL Description: Single-Tone Oscillator. C: Verilog Description: Single-Tone Oscillator. D: HSPICE Reconstruction Program. References. Index.
「Nielsen BookData」 より