Annual Reliability and Maintainability Symposium : 1995 proceedings : Washington, DC USA, 1995 January 16-19

Author(s)

Bibliographic Information

Annual Reliability and Maintainability Symposium : 1995 proceedings : Washington, DC USA, 1995 January 16-19

Institute of Electrical and Electronics Engineers, c1995

  • : soft.
  • : case.
  • : micro.

Other Title

95CH35743

95CB35743

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Note

"IEEE catalog number: 95CH35743"

Details

  • NCID
    BA2526714X
  • ISBN
    • 0780324706
    • 0780324714
    • 0780324722
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [New York]
  • Pages/Volumes
    xx, 535, 101 p.
  • Size
    28 cm
  • Classification
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