Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices

Author(s)

• International Symposium on Corrosion and Reliability of Electronic Materials and Devices
• Comizzoli, Robert B.
• Frankenthal, Robert Peter
• Sinclair, J. D. (James Douglas)
• Electrochemical Society. Corrosion Division
• Electrochemical Society. Electronics Division
• Electrochemical Society. Dielectric Science and Technology Division

Bibliographic Information

Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices

edited by R.B. Comizzoli, R.P. Frankenthal, and J.D. Sinclair ; assistant editors, K.J. Hanson, R.L. Opila, K.M. Takahashi

（Proceedings / [Electrochemical Society], v. 94-29）

Electrochemical Society, c1994

Other Title

Corrosion and reliability of electronic materials and devices

Note

"Corrosion, Electronics, and Dielectric Science and Technology Divisions."

Includes bibliographical references and index

• NCID: BA25540147
• ISBN:
  • 1566770882
• LCCN: 94061175
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pennington, NJ
• Pages/Volumes: ix, 417 p.
• Size: 23 cm
• Classification:
  • LCC : TK7871
  • DC20 : 621.381
• Subject Headings:
  • LCSH : Electronics -- Materials -- Corrosion -- Congresses
  • LCSH : Electronic apparatus and appliances -- Corrosion -- Congresses
• Parent Bibliography ID:
  • BA01323290