Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

Author(s)

• Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
• Schroder, Dieter K.
• Benton, J. L. (Janet L.)
• Rai-Choudhury, P.

Bibliographic Information

Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

editors, D.K. Schroder, J.L. Benton, P. Rai-Choudhury

（Proceedings / [Electrochemical Society], v. 94-33）

Electrochemical Society, c1994

Other Title

Diagnostic techniques for semiconductor materials and devices 1994

Note

Includes bibliographical references and indexes

• NCID: BA25636359
• ISBN:
  • 1566770920
• LCCN: 94061185
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pennington, NJ
• Pages/Volumes: xi, 387 p.
• Size: 23 cm
• Classification:
  • LCC : TK7874.85
  • DC20 : 621.3815/2/0287
• Subject Headings:
  • LCSH : Semiconductors -- Testing -- Congresses
• Parent Bibliography ID:
  • BA01323290