Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California

Author(s)

• Grover, C. P.
• Society of Photo-optical Instrumentation Engineers
• International Symposium on Optical and Optoelectronic Applied Science and Engineering

Bibliographic Information

Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California

C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1332）

SPIE, c1990

• : pt. 1
• : pt. 2

Note

"Part of a six-conference program on Optical Design and Fabrication held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California"--P. x

Includes bibliographical references and index

Details

• NCID: BA25651443
• ISBN:
  • 0819403938
  • 0819403938
• LCCN: 90052826
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: 2 v.
• Size: 28 cm
• Classification:
  • LCC : T50
  • DC20 : 681/.2
• Subject Headings:
  • LCSH : Mensuration -- Congresses
  • LCSH : Optical measurements -- Congresses
• Parent Bibliography ID:
  • BA0022700X