Practical guide to infrared microspectroscopy
著者
書誌事項
Practical guide to infrared microspectroscopy
（Practical spectroscopy, v. 19）
Marcel Dekker, c1995
大学図書館所蔵 全5件
注記
Includes bibliographical references and index
内容説明・目次
内容説明
This work represents a sound introduction to the fundamental principles of infrared microspectroscopy (IMS). It describes how IMS is used to solve specific microanalytical problems in a variety of disciplines, including forensic analysis, art conservation, and geological, pharmaceutical and electronics research. The book discusses when and how to use special techniques such as line scanning, 3-dimensional imaging and attenuated total reflection and grazing-angle spectroscopy.
目次
- Minimizing optical nonlinearities in infrared microspectroscopy
- uniting microscopy and spectroscopy
- infrared microimaging
- application of reflectance microspectroscopy in the electronics industry
- depth profiling and defect analysis of films and laminates - an industrial approach
- infrared microspectroscopy of forensic paint evidence
- forensic examination of textile fibers by infrared microspectroscopy
- infrared microspectroscopy analysis of cultural artifacts
- pharmaceutical applications of infrared microspectroscopy
- infrared microspectroscopy in the geosciences with emphasis on long wavelengths and high pressures
- unique preparation techniques for nanogram samples
- sample preparation techniques for microsamples.
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