High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts

Bibliographic Information

High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts

Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 1384)

SPIE, c1991

Available at  / 2 libraries

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Note

"Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii

Includes bibliographical references and index

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