Laser testing and reliability : 7 November 1991, San Jose, California

Author(s)

• Begley, David L.
• Wang, S. C.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Laser testing and reliability : 7 November 1991, San Jose, California

David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1620）

SPIE, c1992

Note

Includes bibliographical references and index

Details

• NCID: BA25851067
• ISBN:
  • 0819407585
• LCCN: 92080101
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: v, 104 p.
• Size: 28 cm
• Classification:
  • LCC : TA1700
  • DC20 : 621.36/6
• Subject Headings:
  • LCSH : Semiconductor lasers -- Reliability -- Congresses
  • LCSH : Semiconductor lasers -- Testing -- Congresses
• Parent Bibliography ID:
  • BA0022700X