Laser testing and reliability : 7 November 1991, San Jose, California

著者

• Begley, David L.
• Wang, S. C.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Laser testing and reliability : 7 November 1991, San Jose, California

David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1620）

SPIE, c1992

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA25851067
• ISBN:
  • 0819407585
• LCCN: 92080101
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: v, 104 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1700
  • DC20 : 621.36/6
• 件名:
  • LCSH : Semiconductor lasers -- Reliability -- Congresses
  • LCSH : Semiconductor lasers -- Testing -- Congresses
• 親書誌ID:
  • BA0022700X