Beam deflection and scanning technologies : 25 February-1 March 1991, San Jose, California

著者

• Marshall, Gerald F.
• Beiser, Leo
• Society of Photo-optical Instrumentation Engineers
• IS&T--the Society for Imaging Science and Technology

書誌事項

Beam deflection and scanning technologies : 25 February-1 March 1991, San Jose, California

Gerald F. Mashall, Leo Beiser, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; cooperating organizations, Advanced Imaging, Center for Imaging Science/Rochester Institute of Technology, Computer Graphics World

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1454）

SPIE, c1991

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA26080698
• ISBN:
  • 0819405531
• LCCN: 90064089
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: xi, 465 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1750
  • DC20 : 621.381/045
• 件名:
  • LCSH : Electrooptical devices -- Congresses
  • LCSH : Scanning systems -- Congresses
  • LCSH : Optical scanners -- Congresses
• 親書誌ID:
  • BA0022700X